An Eddy Current Parametric Model for Flaw Characterization - Université de technologie de Troyes Access content directly
Conference Papers Year : 1996

An Eddy Current Parametric Model for Flaw Characterization

Remy La
  • Function : Author
Bruno Benoist
  • Function : Author
Benoit de Barmon
  • Function : Author
Jacques Reuchet
  • Function : Author
No file

Dates and versions

hal-02861500 , version 1 (09-06-2020)

Identifiers

  • HAL Id : hal-02861500 , version 1

Cite

Remy La, Bruno Benoist, Benoit de Barmon, Régis Lengellé, Paul Gaillard, et al.. An Eddy Current Parametric Model for Flaw Characterization. 14th World Conference on Non Destructive Testing, Dec 1996, New Delhi, India. ⟨hal-02861500⟩
19 View
0 Download

Share

Gmail Facebook X LinkedIn More