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authFullName_s : Jacques Reuchet

An Eddy Current Model Based on Parametric Description of Induced Current Loops

Remy La , Bruno Benoist , Benoit de Barmon , Régis Lengellé , Paul Gaillard , et al.
Review of Progress in Quantitative Nondestructive Evaluation, Springer US, pp.295-301, 1997, ⟨10.1007/978-1-4615-5947-4_38⟩
Book sections hal-02490351v1

An Eddy Current Parametric Model for Flaw Characterization

Remy La , Bruno Benoist , Benoit de Barmon , Régis Lengellé , Paul Gaillard , et al.
14th World Conference on Non Destructive Testing, Dec 1996, New Delhi, India
Conference papers hal-02861500v1

Edge Detection on Eddy Current Image to Increase Defect Characterization

Bruno Benoist , P. Attaoui , Remy La , Régis Lengellé , Paul Gaillard , et al.
Review of Progress in Quantitative Nondestructive Evaluation, Springer US, pp.829-836, 1996, ⟨10.1007/978-1-4613-0383-1_108⟩
Book sections hal-02862180v1

An Eddy Current Model based on Parametric Description of induced current loops

Remy La , Bruno Benoist , Benoit de Barmon , Régis Lengellé , Paul Gaillard , et al.
QNDE 96, 1996, Brunswick, United States
Conference papers hal-02861566v1