%0 Conference Proceedings %T An Eddy Current Parametric Model for Flaw Characterization %+ CEA/CEREM %+ Laboratoire Modélisation et Sûreté des Systèmes (LM2S) %+ CEA/IPSN %A La, Remy %A Benoist, Bruno %A de Barmon, Benoit %A Lengellé, Régis %A Gaillard, Paul %A Reuchet, Jacques %< avec comité de lecture %( Proceedings of the 14th World Conference on Non Destructive Testing, New Delhi, India, December 1996 %B 14th World Conference on Non Destructive Testing %C New Delhi, India %8 1996-12 %D 1996 %Z Engineering Sciences [physics]Conference papers %G English %L hal-02861500 %U https://utt.hal.science/hal-02861500 %~ CEA %~ CNRS %~ UNIV-TROYES %~ DRT %~ UTT %~ UTT-LIST3N %~ LM2S-UTT