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Edge Detection on Eddy Current Image to Increase Defect CharacterizationReview of Progress in Quantitative Nondestructive Evaluation, Springer US, pp.829-836, 1996, ⟨10.1007/978-1-4613-0383-1_108⟩
Book sections
hal-02862180v1
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An Eddy Current Model Based on Parametric Description of Induced Current LoopsReview of Progress in Quantitative Nondestructive Evaluation, Springer US, pp.295-301, 1997, ⟨10.1007/978-1-4615-5947-4_38⟩
Book sections
hal-02490351v1
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An Eddy Current Parametric Model for Flaw Characterization14th World Conference on Non Destructive Testing, Dec 1996, New Delhi, India
Conference papers
hal-02861500v1
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An Eddy Current Model based on Parametric Description of induced current loopsQNDE 96, 1996, Brunswick, United States
Conference papers
hal-02861566v1
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