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Article Dans Une Revue Applied optics Année : 2007

Scanning near-field optical microscopy signal processing and resolution

Résumé

To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed.
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Dates et versions

hal-02285448 , version 1 (12-09-2019)

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Thomas Grosges, Dominique Barchiesi. Scanning near-field optical microscopy signal processing and resolution. Applied optics, 2007, 46 (12), pp.2248. ⟨10.1364/AO.46.002248⟩. ⟨hal-02285448⟩

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