%0 Journal Article %T Scanning near-field optical microscopy signal processing and resolution %+ Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO) %A Grosges, Thomas %A Barchiesi, Dominique %< avec comité de lecture %@ 1559-128X %J Applied optics %I Optical Society of America %V 46 %N 12 %P 2248 %8 2007 %D 2007 %R 10.1364/AO.46.002248 %Z Physics [physics]/Physics [physics]/Optics [physics.optics] %Z Computer Science [cs]/Signal and Image ProcessingJournal articles %X To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed. %G English %L hal-02285448 %U https://utt.hal.science/hal-02285448 %~ CNRS %~ UNIV-TROYES %~ UTT %~ TEST3-HALCNRS