Scanning Near-field Optical Microscopy (SNOM) using an apertureless probe : tip field enhancement studied by the help of photosensitive materials - Université de technologie de Troyes Accéder directement au contenu
Communication Dans Un Congrès Année : 2002

Scanning Near-field Optical Microscopy (SNOM) using an apertureless probe : tip field enhancement studied by the help of photosensitive materials

Fichier non déposé

Dates et versions

hal-02498950 , version 1 (04-03-2020)

Identifiants

  • HAL Id : hal-02498950 , version 1

Citer

Renaud Bachelot, Fekra H'Dhili, Gilles Lerondel, Dominique Barchiesi, Radouane Fikri, et al.. Scanning Near-field Optical Microscopy (SNOM) using an apertureless probe : tip field enhancement studied by the help of photosensitive materials. Scanning Probe Microscopy Sensors and Nanostructures, May 2002, Las Vegas, United States. ⟨hal-02498950⟩

Collections

CNRS UTT
8 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More