Near Field Optical Microscopy and Spectroscopy with STM and AFM Probes
Abstract
This article deals with a new generation of scanning near field optical
microscopes (SNOM), called apertureless SNOM, based on metallic,
semi-conductive or dielectric probes. The classification of the apertureless
probe among the usual SNOM probes is discussed in the first part. Then,
we present the different apertureless SNOM configurations that we develop,
with various commercial AFM and home-made tungsten tips, and several
illumination and collection modes. Finally, after a preliminary result in near
field imaging, we propose a promising application of such microscopes dedicated
to the near field fluorescence spectroscopy.