Wafer‐level Fabrication of sub 10 nm Gap Hot Spots for Highly Sensitive and Quantification of Biomolecules by Surface Enhanced Raman and Fluorescence Spectroscopies - Université de technologie de Troyes Access content directly
Conference Poster Year : 2019

Wafer‐level Fabrication of sub 10 nm Gap Hot Spots for Highly Sensitive and Quantification of Biomolecules by Surface Enhanced Raman and Fluorescence Spectroscopies

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hal-02291158 , version 1 (18-09-2019)

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  • HAL Id : hal-02291158 , version 1

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Rishabh Rastogi, Pierre-Michel Adam, Sivashankar Krishnamoorthy. Wafer‐level Fabrication of sub 10 nm Gap Hot Spots for Highly Sensitive and Quantification of Biomolecules by Surface Enhanced Raman and Fluorescence Spectroscopies. 4th International Conference on Enhanced Spectrocopies, ICES 4, Jun 2019, London (Ontario), Canada. ⟨hal-02291158⟩

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